Computer simulations analysis for determining the polarity of charge generated by high energy electron irradiation of a thin film

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DOIResolve DOI: http://doi.org/10.1016/j.micron.2017.03.015
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TypeArticle
Journal titleMicron
ISSN0968-4328
Volume100
Pages1022
Subjecthole-free phase plate; volta phase plate; radiation damage; electron beam induced charging; thon rings; fresnel images
AbstractDetailed simulations are necessary to correctly interpret the charge polarity of electron beam irradiated thin film patch. Relying on systematic simulations we provide guidelines and movies to interpret experimentally the polarity of the charged area, to be understood as the sign of the electrostatic potential developed under the beam with reference to a ground electrode. We discuss the two methods most frequently used to assess charge polarity: Fresnel imaging of the irradiated area and Thon rings analysis. We also briefly discuss parameter optimization for hole free phase plate (HFPP) imaging. Our results are particularly relevant to understanding contrast of hole-free phase plate imaging and Berriman effect.
Publication date
LanguageEnglish
AffiliationNational Institute for Nanotechnology; National Research Council Canada
Peer reviewedYes
NPARC number23002388
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Record identifier495b88f1-4caf-48fe-84be-813576183067
Record created2017-10-26
Record modified2017-10-26
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