Scattering lifetimes due to interface roughness with large lateral correlation length in a Al1-xGaxN/GaN two-dimensional electron gas

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DOIResolve DOI: http://doi.org/10.1103/PhysRevB.66.245305
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TypeArticle
Journal titlePhysical review. B, Condensed matter and materials physics
Volume66
Issue24
Pages245305
Publication date
AffiliationNRC Institute for Microstructural Sciences; National Research Council Canada; NRC Steacie Institute for Molecular Sciences
Peer reviewedNo
NPARC number12327945
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Record identifier49c5cd04-bebb-4821-a90f-49e4ccb0bc2a
Record created2009-09-10
Record modified2016-05-09
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