Electron radiation damage of pentacene thin films measured in TEM

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DOIResolve DOI: http://doi.org/10.1017/S1431927605503817
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TypeArticle
Journal titleMicroscopy and Microanalysis
Volume11
IssueS02
Pages20442045; # of pages: 2
Publication date
LanguageEnglish
AffiliationNational Research Council Canada; National Institute for Nanotechnology
Peer reviewedYes
NRC number40
NPARC number12337957
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Record identifier4cc8f52e-aba3-4161-95e5-195ac4a9be75
Record created2009-09-10
Record modified2016-05-09
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