Subwavelength grating crossings for silicon wire waveguides

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DOIResolve DOI: http://doi.org/10.1364/OE.18.016146
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TypeArticle
Journal titleOptics Express
Volume18
Issue15
Pages1614616155; # of pages: 10
AbstractWe report on the design, simulation and experimental demonstration of a new type of waveguide crossing based on subwavelength gratings in silicon waveguides. We used 3D finite-difference time-domain simulations to minimize loss, crosstalk and polarization dependence. Measurement of fabricated devices show that our waveguide crossings have a loss as low as −0.023 dB/crossing, polarization dependent loss of < 0.02 dB and crosstalk <-40 dB.
Publication date
LanguageEnglish
AffiliationNRC Institute for Microstructural Sciences; NRC Genomics and Health Initiative; National Research Council Canada
Peer reviewedYes
NPARC number17326687
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Record identifier4ce7e52d-df34-433c-8537-5b70b7121ecd
Record created2011-03-26
Record modified2016-05-09
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