Measurements of indium segregation in strained InxGa1-xAs/GaAs quantum wells by transmission electron microscopy

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DOIResolve DOI: http://doi.org/10.1080/01418619708207203
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TypeArticle
Journal titlePhilosophical Magazine. A, Physics Of Condensed Matter, Defects And Mechanical Properties.
ISSN01418610
Volume75
Pages803821; # of pages: 19
Publication date
LanguageEnglish
AffiliationNational Research Council Canada; NRC Institute for Microstructural Sciences
Peer reviewedNo
NPARC number12338319
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Record identifier4d95489f-020d-4ea4-afae-7125f2625bf7
Record created2009-09-10
Record modified2016-05-09
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