Calibration specimens for light-element EDX analysis

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TypeArticle
Proceedings titleElectron Microscopy 1998 : Proceedings of the 14th International Congress on Electron Microscopy
Conference14th International Congress on Electron Microscopy (ICEM 14), Cancun, Mexico, August 31 - September 4, 1998
Volume3
Pages569570; # of pages: 2
Publication date
AffiliationNational Research Council Canada; National Institute for Nanotechnology
Peer reviewedNo
NPARC number12328377
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Record identifier4eaf2519-936e-41f3-b0e8-3b894a982aea
Record created2009-09-10
Record modified2016-05-09
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