Imaging of radiation-sensitive samples in transmission electron microscopes equipped with Zernike phase plates

Download
  1. Get@NRC: Imaging of radiation-sensitive samples in transmission electron microscopes equipped with Zernike phase plates (Opens in a new window)
DOIResolve DOI: http://doi.org/10.1016/j.ultramic.2007.03.008
AuthorSearch for: ; Search for: ; Search for: ; Search for:
TypeArticle
Journal titleUltramicroscopy
ISSN0304-3991
Volume108
Issue2
Pages126140; # of pages: 15
SubjectZernike phase plate; Boersch lens; radiation damage; transmission electron microscope; spherical aberration; high-resolution TEM; biological TEM; single molecule TEM; low-voltage TEM
AbstractWe have optimized a bright-field transmission electron microscope for imaging of high-resolution radiation-sensitive materials by calculating the imaging dose n(0) needed to obtain a signal-to-noise ratio (SNR)=5. Installing a Zernike phase plate (ZP) decreases the dose needed to detect single atoms by as much as a factor of two at 300 kV. For imaging larger objects, such as Gaussian objects with full-width at half-maximum larger than 0.15 nm, ZP appears more efficient in reducing the imaging dose than correcting for spherical aberration. The imaging dose n(0) does not decrease with extending of chromatic resolution limit by reducing chromatic aberration, using high accelerating potential (U(0)=300 kV), because the image contrast increases slower than the reciprocal of detection radius. However, reducing chromatic aberration would allow accelerating potential to be reduced leading to imaging doses below 10 e(-)/A(2) for a single iodine atom when a CS-corrector and a ZP are used together. Our simulations indicate that, in addition to microscope hardware, optimization is heavily dependent on the nature of the specimen under investigation.
Publication date
PublisherElsevier
LanguageEnglish
AffiliationNational Research Council Canada; National Institute for Nanotechnology
Peer reviewedYes
Identifier10038139
NPARC number12339181
Export citationExport as RIS
Report a correctionReport a correction
Record identifier531ff168-20b1-4c5f-af2a-659f2882d6ff
Record created2009-09-11
Record modified2016-05-09
Bookmark and share
  • Share this page with Facebook (Opens in a new window)
  • Share this page with Twitter (Opens in a new window)
  • Share this page with Google+ (Opens in a new window)
  • Share this page with Delicious (Opens in a new window)