Exploiting the precision and accuracy of powder diffraction profiles with appropriately parameterized Rietveld refinement models

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TypePresentation
Conference2009 ACA Meeting, 26 July 2009, Toronto, Canada
Pages# of pages: 36
Publication date
LanguageEnglish
AffiliationNational Research Council Canada (NRC-CNRC); NRC Institute for Chemical Process and Environmental Technology; NRC Institute for Research in Construction
Peer reviewedNo
NRC number52049
NPARC number15329271
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Record identifier580c2bb5-67f9-49e2-8fcb-214fed317eab
Record created2010-05-19
Record modified2016-05-09
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