Spontaneous emission and reflectivity measurements for the characterization of facet-coatings of semiconductor lasers

DOIResolve DOI: http://doi.org/10.1109/PN.2015.7292494
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TypeArticle
Proceedings title2015 Photonics North
Conference2015 Photonics North, June 9-11, 2015, Ottawa, Ontario Canada
ISBN978-1-4673-6805-6
Pages11
SubjectLaser coating; Spontaneous emission; Reflectivity;; Laser characterization
AbstractA new method for measuring the spontaneous emissions and spectral reflectivity of the facet coating of ridge lasers is described and demonstrated. We present results of spectrally-controlled coated quantum-dot laser waveguides.
Publication date
PublisherIEEE
LanguageEnglish
AffiliationInformation and Communication Technologies; National Research Council Canada
Peer reviewedYes
NPARC number23000104
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Record identifier58cb3a82-6cbc-4c19-918e-83859d6b3f8a
Record created2016-06-02
Record modified2016-06-02
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