Oxidation mechanisms of β-NiAl + Zr determined by SIMS

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DOIResolve DOI: http://doi.org/10.1016/0010-938X(95)00034-H
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TypeArticle
Journal titleCorrosion Science
Volume37
Issue9
Pages13411364; # of pages: 24
AbstractThe oxidation mechanisms of single crystal Zr-doped β-NiAl from 800 to 1200 °C were determined using primarily secondary ion mass spectrometry (SIMS) imaging and depth profiling. High spatial resolution SIMS imaging provides a means for critically assessing the effects of diffusion through the boundaries of the various morphologies of α-Al2O3 scales that form on β-NiAl. Transient oxidation occurs by outward Al diffusion through transition Al2O3 scales, θ-Al2O3 in this case, for temperatures from 800 to 1100 °C. Steady-state oxidation occurs by counter-diffusion of oxygen inward and both Al and Zr outward through boundaries in the α-Al2O3 ridge morphology.
Publication date
LanguageEnglish
AffiliationNational Research Council Canada; NRC Institute for Microstructural Sciences
Peer reviewedYes
NPARC number12338717
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Record identifier594f75ee-b73e-4d92-9867-6192285abcee
Record created2009-09-10
Record modified2016-05-09
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