In-situ Monitoring of Residual Stress Development During E-Beam Processing

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TypeArticle
ConferenceSAMPE 2004 - 49th International SAMPE Symposium From 5/18/2004 To 5/20/2004, Long Beach, CA
SubjectComposites; Polymers; Electron Beam Curing; Process Modelling; Residual Stress
AffiliationNRC Institute for Aerospace Research; National Research Council Canada
Access conditionavailable
unclassified
unlimited
Peer reviewedYes
NRC numberSMPL-2004-0039
NPARC number8927652
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Record identifier5e684a82-176b-4551-ae10-ecc114e6a31e
Record created2009-04-23
Record modified2016-05-09
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