Polarized raman scattering and localized embedded strain in self-organized Si/Ge nano-structures

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DOIResolve DOI: http://doi.org/10.1063/1.1628403
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TypeArticle
Journal titleApplied Physics Letters
Volume83
Issue24
Pages50355037; # of pages: 3
Publication date
AffiliationNRC Institute for Microstructural Sciences; National Research Council Canada
Peer reviewedNo
NPARC number12744738
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Record identifier5e8604ca-e7de-44d9-a77b-b37f7ea98aff
Record created2009-10-27
Record modified2016-05-09
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