Evaluating visibility and spatial resolution in electron holography

DOIResolve DOI: http://doi.org/10.1017/S1431927608083967
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Proceedings titleMicroscopy and Microanalysis
ConferenceMicroscopy and Microanalysis 2008, 3-7 August 2008, Albuquerque, New Mexico, USA
IssueSupplement S2
Pages854855; # of pages: 2
Publication date
PublisherCambridge University Press
AffiliationNational Institute for Nanotechnology; National Research Council Canada
Peer reviewedYes
NRC number380
NPARC number8926399
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Record identifier5f31caac-fa4e-4f7b-ae2b-636926ae7949
Record created2009-04-23
Record modified2016-05-09
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