In Situ Faraday-Modulated Fast-Nulling Single-Wavelength Ellipsometry of the Growth of Semiconductors, Dielectric and Metal Films

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EditorSearch for: Nalwa, H.
TypeBook Chapter
Book titleThin Films
PublisherAcademic Press
AffiliationNRC Institute for Microstructural Sciences; National Research Council Canada; NRC Institute for Chemical Process and Environmental Technology; NRC Genomics and Health Initiative
Peer reviewedNo
NPARC number12346256
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Record identifier5f4d609f-1b13-474c-bce7-70654befcc6d
Record created2009-09-17
Record modified2016-05-09
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