Three-dimensional imaging metrology: 19-20 January 2009, San Jose, California, USA

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EditorSearch for: Beraldin, J. Angelo; Search for: Cheok, Geraldine S.; Search for: McCarthy, Michael B.
TypeBook
Series titleProceedings of SPIE: the International Society for Optical Engineering; no. 7239
ConferenceIS&T/SPIE Electronic Imaging, Science and Technology, 19-20 January 2009, San Jose, California, USA
ISSN0277-786X
1996-756X
ISBN9780819474896
AbstractFirst conference on 3D Imaging Metrology.
Publication date
PublisherSPIE
Linkhttp://spie.org/Publications/Proceedings/Volume/7239
LanguageEnglish
AffiliationNational Research Council Canada
Peer reviewedYes
NPARC number23001667
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Record identifier6128f49b-9e6d-422d-8754-8ef1af4607cd
Record created2017-03-16
Record modified2017-03-16
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