Composition of porous silicon measured with elastic recoil detection analysis

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EditorSearch for: Lockwood, David
TypeArticle
Proceedings titleThe Physics of Semiconductors
Conference22nd International Conference on the Physics of Semiconductors, August 15-19, 1994, Vancouver, BC, Canada
Volume3
Pages2169
Publication date
PublisherWorld Scientific Publishing
AffiliationNational Research Council Canada; NRC Institute for Microstructural Sciences
Peer reviewedNo
NPARC number12327076
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Record identifier677ececa-1b22-4f65-828f-c04cc9e3e015
Record created2009-09-10
Record modified2016-05-09
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