Eliminating the birefringence in silicon-on-insulator ridge waveguides by use of cladding stress

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DOIResolve DOI: http://doi.org/10.1364/OL.29.002384
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TypeArticle
Journal titleOptics Letters
Volume29
Issue20
Pages23842386; # of pages: 3
Publication date
AffiliationNRC Institute for Microstructural Sciences; National Research Council Canada
Peer reviewedNo
NPARC number12743797
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Record identifier68c6b137-e8ff-4b23-87be-2440c145451f
Record created2009-10-27
Record modified2016-05-09
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