The measurement of the period and strain of semiconductor superlattice systems using HREM

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TypeArticle
Journal titleMicroscopy and Microanalysis
LanguageEnglish
AffiliationNational Research Council Canada; NRC Institute for Fuel Cell Innovation; NRC Steacie Institute for Molecular Sciences
Peer reviewedNo
NPARC number12338646
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Record identifier690e10af-989b-45fd-8339-8bcb38ad5131
Record created2009-09-10
Record modified2016-05-09
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