Thermal stability of SrFeO3/Al2O3 thin films: transmission electron microscopy study and conductometric sensing response

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DOIResolve DOI: http://doi.org/10.1063/1.2957073
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TypeArticle
Journal titleJournal of Applied Physics
Volume104
Issue2
Pages023530023536; # of pages: 7
Subjecttermal stability; conductometric sensing response
Publication date
PublisherAmerican Institute of Physics
Copyright noticeYou may reproduce (print, make photocopies, or download) materials from NPArC without permission for non-commercial purposes (research, education, and private study) only, on the condition that you provide proper attribution of the sources in all copies.
LanguageEnglish
AffiliationNRC Institute for Chemical Process and Environmental Technology (ICPET-ITPCE); National Research Council Canada
Access conditionavailable
unlimited
public
Peer reviewedYes
NRC number51654
NPARC number9069454
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Record identifier69375db3-8b17-42fe-957d-a990a0a2ef6d
Record created2009-10-02
Record modified2017-03-23
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