Chiral modulations and reorientation effects in MnSi thin films

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DOIResolve DOI: http://doi.org/10.1103/PhysRevB.85.094429
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TypeArticle
Journal titlePhysical Review B : Condensed Matter and Materials Physics
Volume85
Issue9
Pages094429-1094429-12
AbstractWe present an experimental and theoretical investigation of the influence of a uniaxial magnetocrystalline anisotropy on the magnetic textures that are formed in a chiral magnetic system. We show that the epitaxially induced tensile stress in MnSi thin films grown on Si(111) creates an easy-plane uniaxial anisotropy. The magnetoelastic shear stress coefficient is derived from SQUID magnetometry measurements in combination with transmission electron microscopy and x-ray diffraction data. Density functional calculations of the magnetoelastic coefficient support the conclusion that the uniaxial anisotropy originates from the magnetoelastic coupling. Theoretical calculations based on a Dzyaloshinskii model that includes an easy-plane anisotropy predict a variety of modulations to the magnetic order that are not observed in bulk MnSi crystals. Evidence for these states is found in the magnetic hysteresis and polarized neutron reflectometry measurements.
Publication date
LanguageEnglish
AffiliationNRC Canadian Neutron Beam Centre; National Research Council Canada
Peer reviewedYes
NPARC number20209244
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Record identifier6ce36bf6-6720-46f4-a24a-3143893b5a87
Record created2012-06-27
Record modified2016-05-09
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