Atomic Force Microscopy and Raman Spectroscopy of Nanoscale Si/SiO2 Superlattices

Alternative titleMicrocrystalline and Nanocrystalline Semiconductors-2000
AuthorSearch for: ; Search for: ; Search for: ; Search for: ; Search for: ; Search for: ; Search for:
EditorSearch for: Jr, B.; Search for: Fauchet, P.; Search for: Buriak, J.; Search for: Canham, L.; Search for: Koshida, N.
TypeArticle
Volume638
PagesF541
Publication date
PublisherMRS
PlacePittsburgh, PA
AffiliationNRC Institute for Microstructural Sciences; National Research Council Canada
Peer reviewedNo
NPARC number12346413
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Record identifier6d4ac566-d46b-4300-af88-3e207138c1ce
Record created2009-09-17
Record modified2016-05-09
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