Photodegradation versus hot-electron impact for electrical tree inception at low electric fields

DOIResolve DOI: http://doi.org/10.1109/ICPADM.1991.172352
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TypeArticle
ConferenceProceedings of the 3rd International Conference on Properties and Applications of Dielectric Materials, July 8-12, 1991, Tokyo, Japan
ISBN0879425687
Pages5154, vol. 1
LanguageEnglish
AffiliationNRC Institute for National Measurement Standards; National Research Council Canada
Peer reviewedNo
NRC number1746
NPARC number8897093
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Record identifier70a96f9e-bca0-49e3-8a99-ea8731d4657d
Record created2009-04-22
Record modified2016-05-09
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