Measurement of birefringence in thin-film waveguides by Rayleigh scattering

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DOIResolve DOI: http://doi.org/10.1364/OL.28.001778
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TypeArticle
Journal titleOptics Letters
Volume28
Issue19
Pages17781780; # of pages: 3
Publication date
AffiliationNRC Institute for Microstructural Sciences; National Research Council Canada; NRC Steacie Institute for Molecular Sciences
Peer reviewedNo
NPARC number12744646
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Record identifier7132847f-dff4-4e32-9114-8d52ecc636dd
Record created2009-10-27
Record modified2016-05-09
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