Traceability and metrological equivalence

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TypeArticle
ConferenceNCSL International 2000 Workshop and Symposium : metrology, intangible, imbedded support? : conference proceedings, July 16-20, 2000, Toronto, Ontario, Canada
Pages6 p.
LanguageEnglish
AffiliationNRC Institute for National Measurement Standards; National Research Council Canada
Peer reviewedNo
NRC number827
NPARC number8898448
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Record identifier7bba8a2b-57ed-406f-a517-89b54f4335f5
Record created2009-04-22
Record modified2016-05-09
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