Methods to recognize the sample position for most precise interferometric length measurements

DOIResolve DOI: http://doi.org/10.1117/12.555835
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TypeArticle
ConferenceInterferometry XII : applications : [proceedings of the] 12th Laser Interferometry Conference, August 4-5, 2004, Denver, Colorado, USA
ISSN0277-786X
ISBN0819454702
Pages237247; # of pages: 11
LanguageEnglish
AffiliationNRC Institute for National Measurement Standards
Peer reviewedNo
NRC number746
NPARC number8898705
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Record identifier80c410a8-9df4-47db-9c70-123f74435346
Record created2009-04-22
Record modified2016-05-09
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