Physical properties of lanthanum monosulfide thin films grown on (100) silicon substrates

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DOIResolve DOI: http://doi.org/10.1063/1.2201998
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TypeArticle
Journal titleJournal of Applied Physics
Volume99
Issue12
Pages123502
Publication date
AffiliationNational Research Council Canada; NRC Institute for Microstructural Sciences
Peer reviewedNo
NPARC number12744060
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Record identifier8273b776-a68c-48fc-876c-3d159a58c252
Record created2009-10-27
Record modified2016-05-09
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