Simulation and Measurement of the Self-Heating in GaN HFETs

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DOIResolve DOI: http://doi.org/10.1002/pssc.200674252
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TypeArticle
Journal titlephysica status solidi (c)
Volume4
Issue5
Pages16531657; # of pages: 5
Publication date
AffiliationNRC Institute for Microstructural Sciences; National Research Council Canada
Peer reviewedNo
NPARC number12743873
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Record identifier85559cec-3da4-497a-be62-9bb95f1f1d2a
Record created2009-10-27
Record modified2016-05-09
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