Asymmetrical dual-cavity filters and their application to thickness uniformity monitoring

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DOIResolve DOI: http://doi.org/10.1364/OE.11.003393
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TypeArticle
Journal titleOptics Express
Volume11
Issue25
Pages33933403; # of pages: 11
Publication date
LanguageEnglish
AffiliationNational Research Council Canada; NRC Institute for Microstructural Sciences
Peer reviewedNo
NPARC number12744818
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Record identifier874070b3-213c-42f8-86be-0a2286af7c3d
Record created2009-10-27
Record modified2016-05-09
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