Stress distribution in patterned-substrate InGaAs/InP

Alternative titleSPIE
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TypeArticle
ConferenceSPIE Optoelectronics Materials and Devices II, 2000, Taipei
Volume4078
Pages659
AffiliationNRC Institute for Microstructural Sciences; National Research Council Canada
Peer reviewedNo
NPARC number12346219
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Record identifier878cd159-8c93-4580-b0e5-a46fb592af51
Record created2009-09-17
Record modified2016-05-09
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