Surface relaxations, current enhancements, and absolute distances in high resolution scanning tunneling microscopy

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DOIResolve DOI: http://doi.org/10.1103/PhysRevLett.87.236104
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TypeArticle
Journal titlePhysical Review Letters
ISSN0031-9007
Volume87
Issue23
Pages236104-1236104-4; # of pages: 4
AbstractWe have performed the most realistic simulation to date of the operation of a scanning tunneling microscope. Probe-sample distances from beyond tunneling to actual surface contact are covered. We simultaneously calculate forces, atomic displacements, and tunneling currents, allowing quantitative comparison with experimental values. A distance regime below which the probe becomes unstable is identified. It is shown that the real distance differs substantially from previous estimates because of large atomic displacements on the surface and at the probe tip.
Publication date
LanguageEnglish
AffiliationNational Research Council Canada; NRC Steacie Institute for Molecular Sciences
Peer reviewedNo
NRC publication
This is a non-NRC publication

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Identifier10109961
NPARC number12339030
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Record identifier883598e5-d34c-4c2f-b4d4-f0cdb30bd102
Record created2009-09-11
Record modified2016-05-09
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