Raman spectroscopy and optical properties of porous silicon

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DOIResolve DOI: http://doi.org/10.1007/978-94-011-1683-1_37
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TypeBook Chapter
Book titlePhonons in Semiconductor Nanostructures
Series titleNATO ASI Series; no. 236
ISSN0168-132X
ISBN978-94-010-4736-4
978-94-011-1683-1
Pages383392
SubjectPhysics, general; Condensed Matter Physics; Optical and Electronic Materials; Surfaces and Interfaces, Thin Films
AbstractRaman spectroscopy has shown that porous Si films produced by electrochemical and chemical dissolution of Si contain crystalline Si wires and spherites ~ 3 nm in diameter and/or amorphous Si. The optical absorption and photoluminescence spectra obtained from most of the samples are consistent with the quantum confinement of excitons in Si nanostructures. Other samples composed only of amorphous Si produced a different photoluminescence attributed to the formation of silicon oxyhydride species.
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LanguageEnglish
AffiliationNRC Institute for Microstructural Sciences; National Research Council Canada
Peer reviewedYes
NPARC number23000346
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Record identifier89afdd17-692e-48c5-91de-4cfc0dc6d8e6
Record created2016-07-08
Record modified2016-07-08
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