Photoluminescence efficiency and size distribution of self assembled ge dots on porous TiO 2

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DOIResolve DOI: http://doi.org/10.1166/jnn.2011.4311
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TypeArticle
Journal titleJournal of Nanoscience and Nanotechnology
ISSN1533-4880
Volume11
Issue10
Pages91909195; # of pages: 6
SubjectDot diameter; Dot size; Emission efficiencies; Energy dependent; Ge dots; Mesoporous TiO; Mesoporous titanium dioxide; Nanodots; Near-infrared bands; Peak energy; Photoluminescence efficiency; PL bands; PL spectra; Porous TiO; Self-assembled; Si(0 0 1); Theoretical models; Tight binding; Atomic force microscopy; Germanium; Molecular beam epitaxy; Photoluminescence; Self assembly; Titanium dioxide; Size distribution
AbstractFor Ge nanodots ∼20 nm in diameter grown by annealing a thin amorphous Ge layer deposited by molecular beam epitaxy on a mesoporous TiO 2 layer on Si(001), photoluminescence (PL) was observed as a wide near-infrared band near 800 meV. Using a tight binding theoretical model, the energy-dependent PL spectrum was transformed into a dependence on dot size. The average dot size determined the peak energy of the PL band and its shape depended on the size distribution, including bandgap enlargement due to quantum confinement. Combining the dot sample PL with an established dependence of emission efficiency on dot diameter, it was possible to derive a dot size distribution and compare it with results obtained independently from atomic force microscopy. Copyright © 2011 American Scientific Publishers. All rights reserved.
Publication date
LanguageEnglish
AffiliationMeasurement Science and Standards; National Research Council Canada
Peer reviewedYes
NPARC number21271634
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Record identifier8c05c494-865e-4f78-bfac-3e8ded5313d3
Record created2014-03-24
Record modified2016-05-09
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