Picosecond Imaging of Hot Electron Emission from CMOS Circuitry

Alternative titleSPIE
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TypeArticle
Conference2000
Volume4078
Pages298
AffiliationNRC Institute for Microstructural Sciences; National Research Council Canada
Peer reviewedNo
NPARC number12346208
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Record identifier8c12e6ad-2cac-47e7-9805-5d139d88607c
Record created2009-09-17
Record modified2016-05-09
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