Measuring and Modeling the Scaling Trend of the RF Noise in MOSFETs

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TypeArticle
Conference64th IEEE Device Research Conference, 2006
Pages6566; # of pages: 2
AffiliationNRC Institute for Microstructural Sciences; National Research Council Canada
Peer reviewedNo
NPARC number12346594
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Record identifier8e8b809f-8e05-4aa3-bec7-338ddbb9f440
Record created2009-09-17
Record modified2016-05-09
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