Scanning tunneling microscopy characterization of low-profile crystalline TiSi2 microelectrodes on a Si(111) surface

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DOIResolve DOI: http://doi.org/10.1063/1.1922572
AuthorSearch for: ; Search for:
TypeArticle
Journal titleApplied Physics Letters
Volume86
Pages3101–; # of pages: 1
Subjectannealing; electrical contacts; electrical resistivity; elemental semiconductors; microelectrodes; scanning tunnelling microscopy; semiconductor-insulator boundaries; silicon; surface reconstruction; thermal stability; titanium compounds
AbstractMicroscopic four-probe TiSi2 electrodes were fabricated on clean Si(111) surfaces and characterized using scanning tunneling microscopy with atomic resolution. The TiSi2 electrodes remained intact, and the clean Si(111)-7?7 structure was observed near the electrodes after annealing the Si substrate up to 1200 ?C. The TiSi2 electrodes were formed with a high density of large silicide plateaus. Each plateau was formed from stacked atomically flat layers comprised of atomic rows, which have been assigned as C54 phase with an epitaxial relation of TiSi2(311)||Si(111). The TiSi2 probes have the desired properties of very low profiles, low resistance, and thermal as well as chemical stability, thereby enabling the direct measurement of electrical transport properties of low-dimensional structures fabricated on clean Si surfaces.
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AffiliationNational Research Council Canada; National Institute for Nanotechnology
Peer reviewedNo
NPARC number12338137
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Record identifier8fe10924-3c91-4da7-b7cc-9f5a729070b3
Record created2009-09-10
Record modified2016-05-09
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