Control of island formation on silicon surfaces using ultra-high-vacuum scanning electron microscopy

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TypeArticle
Journal titleJournal of Electron Microscopy
Volume49
Issue2
Pages225229; # of pages: 5
Publication date
Linkhttp://jmicro.oxfordjournals.org/cgi/content/abstract/49/2/225
AffiliationNRC Institute for Microstructural Sciences; National Research Council Canada
Peer reviewedNo
NPARC number12744707
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Record identifier91297693-efcc-4678-b190-297d4682e8ae
Record created2009-10-27
Record modified2016-05-09
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