Detailed studies of molecular conductance using atomic resolution scanning tunneling microscopy

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DOIResolve DOI: http://doi.org/10.1021/nl0521569
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TypeArticle
Journal titleNano Letters
ISSN1530-6984
Volume6
Issue3
Pages390397; # of pages: 8
AbstractAtomically resolved scanning tunneling microscopy and spectroscopy (STM/STS) have been used to carefully examine the relationship between molecular conductivity and the adsorption state of various organic molecules on silicon surfaces. We show that the particular configuration of styrene and cyclopentene molecules on silicon affects the conductivity of the molecules. Detailed correlation of STM images with point specific current-voltage spectroscopy reveal that observed negative peaks are due to random configuration changes driven by inelastically scattered electrons and not due to tuned alignment of molecule and electrode levels. These random processes, which include molecular rearrangement, desorption, and/or decomposition occur with increasing frequency at larger voltage and current settings.
Publication date
LanguageEnglish
AffiliationNational Research Council Canada; National Institute for Nanotechnology
Peer reviewedYes
Identifier19345410
NRC number86
NPARC number12328180
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Record identifier97ca0cd7-2562-42cf-bf63-015ec819303d
Record created2009-09-10
Record modified2016-05-09
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