Direct observation of waveguide formation in KGd(WO4)2 by low dose H+ ion implantation

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DOIResolve DOI: http://doi.org/10.1063/1.2340496
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TypeArticle
Journal titleApplied Physics Letters
Volume89
Issue11
Article number111116
Pages111116-1111116-3
AbstractIn this letter, a direct measurement of a refractive index change in potassium gadolinium tungstate (KGW) created by a low-dose ion implantation of 1 MeV hydrogen ions is reported. The characterization was performed using both microreflectivity and Raman spectroscopy measurements. The microreflectivity results show both negative and positive changes in refractive index in the damage region when measuring refractive index along different polarization axes. Micro-Raman spectroscopy analysis shows preservation of the Raman characteristics of KGW in the nondamaged crystal regions. These results show that ion implantation in KGW has a great potential for fabricating waveguide structures in Raman-based photonic devices.
Publication date
LanguageEnglish
AffiliationNRC Institute for Microstructural Sciences; National Research Council Canada
Peer reviewedYes
NPARC number20154423
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Record identifier982f4ceb-de24-4932-acd6-07ac51c46ead
Record created2012-06-22
Record modified2016-05-09
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