Surface damage formation during ion-beam thinning of samples for transmission electron microscopy

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DOIResolve DOI: http://doi.org/10.1016/S0304-3991(00)00096-6
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TypeArticle
Journal titleUltramicroscopy
Volume87
Issue3
Pages97104; # of pages: 8
Publication date
AffiliationNRC Institute for Microstructural Sciences; National Research Council Canada; NRC Institute for National Measurement Standards
Peer reviewedNo
NPARC number12743861
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Record identifier986ae842-eb45-4f83-823b-d4ac2d8f8b8e
Record created2009-10-27
Record modified2016-05-09
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