Electrical and optical properties of erbium in MBE silicon and Si/Ge alloys

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TypeArticle
ConferenceSilicon molecular beam epitaxy : symposium, April 29-May 3, 1991, Anaheim, California, USA
ISSN0272-9172
ISBN155899114X
Pages367371; # of pages: 5
LanguageEnglish
AffiliationNRC Institute for National Measurement Standards; NRC Institute for Microstructural Sciences; National Research Council Canada
Peer reviewedNo
NRC number1200
NPARC number8899210
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Record identifier98ead462-00e4-4db0-bb95-83d170bc4724
Record created2009-04-22
Record modified2016-05-09
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