A well defined electron beam source produced by the controlled field assisted etching of metal tips to < 1 nm radius

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TypeArticle
Journal titleJournal of Scanning Probe Microscopy
Volume2
Issue1-2
Pages14; # of pages: 4
Publication date
AffiliationNRC National Institute for Nanotechnology; National Research Council Canada
Peer reviewedYes
NRC number525
NPARC number8926365
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Record identifier9cec4ae2-a405-47bb-8d09-521b2cfdbb2a
Record created2009-04-23
Record modified2016-05-09
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