Enhanced birefringence in vacuum evaporated silicon thin films

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DOIResolve DOI: http://doi.org/10.1364/AO.43.005343
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TypeArticle
Journal titleApplied Optics
Volume43
Issue28
Pages53435349; # of pages: 7
Publication date
AffiliationNRC Institute for Microstructural Sciences; National Research Council Canada
Peer reviewedNo
NPARC number12744534
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Record identifier9dac7c6e-91ee-4329-87ba-edef012ddd4a
Record created2009-10-27
Record modified2016-05-09
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