Artefacts for surface measurement

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Proceedings titleProceedings of SPIE
ConferenceSPIE Optical Metrology: Videometrics, Range Imaging and Applications, May 23-26, 2011, Munich, Germany
SubjectMetrology; Artefacts; Freeform Measurement; Best Practice
AbstractFlexible manufacturing technologies are supporting the routine production of components with freeform surfaces in a wide variety of materials and surface finishes. Such surfaces may be exploited for both aesthetic and performance criteria for a wide range of industries, for example automotive, aircraft, small consumer goods and medial components. In order to ensure conformance between manufactured part and digital design it is necessary to understand, validate and promote best practice of the available measurement technologies. Similar, but currently less quantifiable, measurement requirements also exist in heritage, museum and fine art recording where objects can be individually hand crafted to extremely fine levels of detail. Optical 3D measurement systems designed for close range applications are typified by one or more illumination sources projecting a spot, line or structured light pattern onto a surface or surfaces of interest. Reflections from the projected light are detected in one or more imaging devices and measurements made concerning the location, intensity and optionally colour of the image. Coordinates of locations on the surface may be computed either directly from an understanding of the illumination and imaging geometry or indirectly through analysis of the spatial frequencies of the projected pattern. Regardless of sensing configuration some independent means is necessary to ensure that measurement capability will meet the requirements of a given level of object recording and is consistent for variations in surface properties and structure. As technologies mature, guidelines for best practice are emerging, most prominent at the current time being the German VDI/VDE 2634 and ISO/DIS 10360-8 guidelines. This considers state of the art capabilities for independent validation of optical non-contact measurement systems suited to the close range measurement of tabletop sized manufactured or crafted objects and invites ISPRS participants to become involved with a WG V/1 workplan to explore artefact performance and suitability.
Publication date
AffiliationNational Research Council Canada (NRC-CNRC); NRC Institute for Information Technology
Peer reviewedYes
NPARC number16285592
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Record identifier9e97cfa8-2580-442d-b8ce-641f63cb0943
Record created2010-11-03
Record modified2016-05-09
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