Shape resonances above the Si 2p threshold in SiF4

Download
  1. Get@NRC: Shape resonances above the Si 2p threshold in SiF4 (Opens in a new window)
DOIResolve DOI: http://doi.org/10.1063/1.450131
AuthorSearch for: ; Search for: ; Search for: ; Search for: ; Search for: ; Search for: ; Search for:
TypeArticle
Journal titleThe Journal of Chemical Physics
ISSN0021-9606
Volume84
Issue5
Pages59; # of pages: 5
Subjectvalence bands; band structure; kinetic theory; photoelectron spectroscopy; photons
AbstractUsing monochromatized synchrotron radiation and angle integrated photoelectron spectroscopy, the Si 2p, Si L V V Auger, and F 2s cross sections have been obtained for SiF4 molecules in the gas phase between 116 and 150 eV photon energies. These cross sections and the Si 2p β value have also been calculated using the MS-Xα method. There is qualitative agreement between theory and experiment. Together with recent experimental and theoretical Si 2p cross sections from SiCl4 and valence band cross sections on SiF4, the two major resonances at 5 and 22 eV kinetic energies are assigned as t 2 resonances. The valence band branching ratios are not affected by interchannel coupling above the Si 2p threshold.
Publication date
LanguageEnglish
AffiliationNational Research Council Canada
Peer reviewedYes
NRC number24888
NPARC number21275086
Export citationExport as RIS
Report a correctionReport a correction
Record identifiera05b2b27-2380-406c-8ee3-7f6a498d4c85
Record created2015-05-07
Record modified2016-05-09
Bookmark and share
  • Share this page with Facebook (Opens in a new window)
  • Share this page with Twitter (Opens in a new window)
  • Share this page with Google+ (Opens in a new window)
  • Share this page with Delicious (Opens in a new window)