TEM characterization of phase separation and transformation at the thin film intefaces in the SrFeO2.5+x/SiO2/Si system

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DOIResolve DOI: http://doi.org/10.1017/S1431927605504215
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TypeArticle
Journal titleMicroscopy and Microanalysis
Volume11
IssueSupplement S02
Pages19621963; # of pages: 2
SubjectTransmission electron microscopy (TEM); thin film; pulsed laser deposition (PLD); amorphous film
Publication date
PublisherCambridge University Press
LanguageEnglish
AffiliationNRC Institute for Chemical Process and Environmental Technology (ICPET-ITPCE); National Research Council Canada
Access conditionavailable
unlimited
public
Peer reviewedYes
NRC number51834
NPARC number11786482
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Record identifiera31fbb95-60c6-44c3-adfd-f7ebd4dce978
Record created2009-10-02
Record modified2016-05-09
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