Improving the energy resolution of X-ray and electron energy-loss spectra

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DOIResolve DOI: http://doi.org/10.1016/j.micron.2005.11.005
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TypeArticle
Journal titleMicron
ISSN0968-4328
Volume37
Issue4
Pages310315; # of pages: 6
SubjectEELS; energy resolution; maximum entropy; maximum likelihood; monochromator
AbstractWe discuss some practical problems of improving the resolution of X-ray and electron spectra. Iterative Bayesian methods promise greater resolution enhancement than Fourier techniques but they also give rise to spectral artifacts. Satellite peaks are generated adjacent to strong peaks in the original spectrum and oscillatory artifacts become prominent after a large number of iterations, particularly when the original data contain high noise content. In the case of valence-electron energy-loss spectra, satellite peaks are reduced by removing the zero-loss peak prior to spectral sharpening. Even so, care should be exercised in interpreting low intensity at low energy loss (after sharpening) as evidence for a bandgap in the electronic density of states.
Publication date
PublisherElsevier
LanguageEnglish
AffiliationNational Research Council Canada; National Institute for Nanotechnology
Peer reviewedYes
NPARC number12339094
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Record identifiera50a9eb1-5e97-46ed-aae5-dae3658844e5
Record created2009-09-11
Record modified2016-05-09
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