Fourier Transform Estimation of Reflecting Thin Film Thickness

Alternative titleProc-SPIE
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TypeArticle
Volume5963
Publication date
AffiliationNRC Institute for Microstructural Sciences; National Research Council Canada
Peer reviewedNo
NPARC number12346603
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Record identifiera5c17cb4-fbe4-4145-8073-b78cf1b1d6cf
Record created2009-09-17
Record modified2016-05-09
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