Raman scattering studies of Si[1-x]Ge[x] layers grown by atmospheric pressure chemical vapor deposition

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TypeArticle
ConferenceSemiconductor heterostructures for photonic and electronic applications : symposium, November 30-December 4, 1992, Boston, Massachusetts, USA
ISSN0272-9172
ISBN155899176X
Pages473478; # of pages: 6
LanguageEnglish
AffiliationNRC Institute for National Measurement Standards
Peer reviewedNo
NRC number4385
NPARC number8899432
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Record identifiera6a9a099-7f66-4f3d-87fa-66314ae6f7e7
Record created2009-04-22
Record modified2016-05-09
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