The peak and average temperature in a self-heated GaN HFET

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DOIResolve DOI: http://doi.org/10.1016/j.sse.2006.11.001
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TypeArticle
Journal titleSolid State Electronics
Volume51
Issue1
Pages142146; # of pages: 5
Publication date
AffiliationNRC Institute for Microstructural Sciences; National Research Council Canada
Peer reviewedNo
NPARC number12744832
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Record identifierafe30469-33f3-4a07-8e42-e11355dcb384
Record created2009-10-27
Record modified2016-05-09
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