(Invited) A "cook's tour" of two decades of research into the optical properties of nanostructured silicon materials

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DOIResolve DOI: http://doi.org/10.1149/05037.0039ecst
AuthorSearch for:
TypeArticle
Proceedings titlePits and Pores 5: A Symposium in Honor of David Lockwood
Series titleECS Transactions; Volume 50
ConferencePRiME 2012: Pits and Pores 5: A Symposium in Honor of David Lockwood, October 7-12, 2012, Honolulu, Hawaii
ISSN1938-5862
ISBN978-1-62332-073-7
978-1-60768-425-1
Pages3954; # of pages: 16
SubjectExperimental determination; Fundamental band gap; Historical account; Nanostructured silicon; Quantum confinement effects; Silicon nano structures; Strong confinement; Ultra-thin structures; Energy gap; Nanocrystalline silicon; Semiconductor quantum wells; Silicon oxides; Amorphous silicon
AbstractAmongst a number of diverse approaches to engineering efficient light emission in silicon nanostructures, one system that has received considerable attention has been Si/SiO2 quantum wells. Engineering such structures has not been easy, because to observe the desired quantum confinement effects, the quantum well thickness has to be less than 5 nm. Nevertheless, such ultra thin structures have now been produced by a variety of techniques. The SiO 2 layers are amorphous, but the silicon layers can range from amorphous through nanocrystalline to single-crystal form. The fundamental band gap of the quantum wells has been measured primarily by optical techniques and strong confinement effects have been observed. A detailed comparison is made between theoretical and experimental determinations of the band gap in Si/SiO2 quantum wells. The review article is prefaced with a historical account of the Pits and Pores Symposium series and a personal academic history of the author. © The Electrochemical Society.
Publication date
LanguageEnglish
AffiliationMeasurement Science and Standards; National Research Council Canada
Peer reviewedYes
NPARC number21270070
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Record identifierb258d324-3f3f-4b91-9420-776e230ae50e
Record created2013-12-19
Record modified2016-05-09
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